Dr. Gurcan has been elected to the level of Senior Member within the professional organization known as SPIE, the premiere professional organization for optics and photonics, serving more than 235,000 constituents from approximately 155 countries. This not-for-profit society advances emerging technologies through interdisciplinary information exchange, continuing education, publications, patent precedent, and career and professional growth.
SPIE considers Senior Members as "Members of distinction who will be honored for their professional experience, their active involvement with the optics community and SPIE, and/or significant performance that sets them apart from their peers." Dr. Gurcan has been elected to this grade because of his achievements in computer-assisted analysis of radiological and microscopic image analysis. Dr. Gurcan currently chairs the SPIE Medical Imaging Digital Pathology Conference. In addition to being an SPIE senior member, he is also a senior member of IEEE and RSNA.
Further information can be found at http://spie.org/x19144.xml.
To read more about the research Dr. Gurcan is involved in and his academic background, please visit her personal profile and his lab page.